Reverse Leakage Current Hysteresis in GaN Schottky Barrier Diodes Interpreted in Terms of a Trap Energy Band
- Pena, R.A.
- Orfao, B.
- Iniguez-De-La-Torre, I.
- Paz, G.
- Daher, M.A.
- Roelens, Y.
- Zaknoune, M.
- Mateos, J.
- Gonzalez, T.
- Vasallo, B.G.
- Perez, S.
ISSN: 1557-9646, 0018-9383
Year of publication: 2024
Volume: 71
Issue: 8
Pages: 4524-4529
Type: Article