Monte carlo comparative study of current-mode noise in Si/Si1-xGexstrained heterojunctions

  1. Martin, M.J.
  2. Pardo, D.
  3. Velázquez, J.E.
Proceedings:
European Solid-State Device Research Conference

ISSN: 1930-8876

ISBN: 2863322214

Year of publication: 1997

Pages: 340-343

Type: Conference paper

DOI: 10.1109/ESSDERC.1997.194435 GOOGLE SCHOLAR