Monte Carlo characterization of fabricated partially-depleted SOI MOSFETs: High-frequency performance

  1. Rengel, R.
  2. Martín, M.J.
  3. Pailloncy, G.
  4. Dambrine, G.
  5. Danneville, F.
Actes de conférence:
2005 Spanish Conference on Electron Devices, Proceedings

ISBN: 9780780388109

Année de publication: 2005

Volumen: 2005

Pages: 373-376

Type: Communication dans un congrès

DOI: 10.1109/SCED.2005.1504408 GOOGLE SCHOLAR
La source de données: Scopus