1/f noise in p-channel screen-grid field effect transistors (SGrFETs) as a device evaluation tool
- Fobelets, K.
- Rumyantsev, S.L.
- Ding, P.W.
- Velazquez-Perez, J.E.
ISSN: 0094-243X, 1551-7616
ISBN: 9780735406650
Year of publication: 2009
Volume: 1129
Pages: 349-352
Type: Conference paper