Monte Carlo analysis of III-V PIN diodes for tunnel-FETs and Impact Ionization-MOSFETs

  1. Vasallo, B.G.
  2. Talbo, V.
  3. Gonzalez, T.
  4. Lechaux, Y.
  5. Wichmann, N.
  6. Bollaert, S.
  7. Mateos, J.
Actas:
2017 Spanish Conference on Electron Devices, CDE 2017

ISBN: 9781509050727

Ano de publicación: 2017

Tipo: Achega congreso

DOI: 10.1109/CDE.2017.7905210 GOOGLE SCHOLAR