Neural networks based approach for fault detection and diagnosis: application to a real process

  1. De la Fuente, M.J.
  2. Vega, P.
Proceedings:
IEEE Conference on Control Applications - Proceedings

Year of publication: 1995

Pages: 188-193

Type: Conference paper

DOI: 10.1109/CCA.1995.555678 GOOGLE SCHOLAR
Data source: Scopus