Analysis of trap states in AlGaN/GaN self-switching diodes via impedance measurements

1. Pérez-Martín, E.
2. Vaquero, D.
3. Sánchez-Martín, H.
4. Gaquière, C.
5. Raposo, V.J.
6. González, T.
7. Mateos, J.
8. Iñiguez-de-la-Torre, I.