Technological Parameters and Edge Fringing Capacitance in GaN Schottky Barrier Diodes: Monte Carlo Simulations
- Orfao, B.
- Vasallo, B.G.
- Moro-Melgar, D.
- Zaknoune, M.
- Di Gioia, G.
- Samnouni, M.
- Perez, S.
- Gonzalez, T.
- Mateos, J.
Actes de conférence:
Proceedings of the 2021 13th Spanish Conference on Electron Devices, CDE 2021
ISBN: 9781665444521
Année de publication: 2021
Pages: 94-97
Type: Communication dans un congrès