Noise Behavior of InP-Based double-gate and standard HEWS: a comparison
- Vasallo, B. G.
- Gonzalez, T.
- Pardo, D.
- Mateos, J.
- Wichmann, N.
- Bollaert, S.
- Roelens, Y.
- Cappy, A.
- Tacano, M (coord.)
- Yamamoto, Y (coord.)
- Nakao, M (coord.)
ISSN: 0094-243X
ISBN: 978-0-7354-0432-8
Year of publication: 2007
Volume: 922
Pages: 167-168
Congress: 19th International Conference on Noise and Fluctuations
Type: Conference paper