1/f Noise in p-Channel Screen-Grid Field Effect Transistors (SGrFETs) as a Device Evaluation Tool
- Fobelets, K.
- Rumyantsev, S. L.
- Ding, P. W.
- Velazquez-Perez, J. E.
- Macucci, M (coord.)
- Basso, G (coord.)
ISSN: 0094-243X
ISBN: 978-0-7354-0665-0
Year of publication: 2009
Volume: 1129
Pages: 349-350
Congress: 20th International Conference on Noise and Fluctuations
Type: Conference paper