Intrinsic Noise Sources in a Schottky Barrier MOSFET: a Monte Carlo Analysis
- Pascual Corral, Elena
- Rengel, Raul
- Martin, Maria J.
- Macucci, M (coord.)
- Basso, G (coord.)
ISSN: 0094-243X
ISBN: 978-0-7354-0665-0
Year of publication: 2009
Volume: 1129
Pages: 329-332
Congress: 20th International Conference on Noise and Fluctuations
Type: Conference paper