Interface roughness effects in Gaussian superlattices

  1. Banfi, F.
  2. Bellani, V.
  3. Gómez, I.
  4. Diez, E.
  5. Domínguez-Adame, F.
Revue:
Semiconductor Science and Technology

ISSN: 0268-1242

Année de publication: 2001

Volumen: 16

Número: 5

Pages: 304-309

Type: Article

DOI: 10.1088/0268-1242/16/5/305 GOOGLE SCHOLAR
La source de données: Scopus