On the spectral strength of the noise source entering the transfer impedance method

  1. Shiktorov, P.
  2. Gružinskis, V.
  3. Starikov, E.
  4. González, T.
  5. Mateos, J.
  6. Pardo, D.
  7. Reggiani, L.
  8. Varani, L.
Revue:
Applied Physics Letters

ISSN: 0003-6951

Année de publication: 1997

Volumen: 71

Número: 21

Pages: 3093-3095

Type: Article

DOI: 10.1063/1.120256 GOOGLE SCHOLAR
La source de données: Scopus