Microscopic analysis of the influence of strain and band-gap offsets on noise characteristics in Si1-xGex/Si heterojunctions

  1. Martinez, M.J.M.
  2. Pardo, D.
  3. Velázquez, J.E.
Journal:
Journal of Applied Physics

ISSN: 0021-8979

Year of publication: 1998

Volume: 84

Issue: 9

Pages: 5012-5020

Type: Article

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Data source: Scopus