Monte Carlo study of sub-0.1 μm Si0.97C0.03/Si MODFET: electron transport and device performance

  1. Dollfus, P.
  2. Galdin, S.
  3. Hesto, P.
  4. Velazquez, J.E.
Journal:
IEEE Transactions on Electron Devices

ISSN: 0018-9383

Year of publication: 2000

Volume: 47

Issue: 6

Pages: 1247-1250

Type: Article

DOI: 10.1109/16.842969 GOOGLE SCHOLAR
Data source: Scopus