Microscopic analysis of voltage noise operation mode in SiGe/Si bipolar heterojunctions: Influence of the SiGe strained layer
- Martín, M.J.
- Pardo, D.
- Velázquez, J.E.
ISSN: 0021-8979
Année de publication: 2000
Volumen: 88
Número: 3
Pages: 1511-1514
Type: Article