High injection effects on noise characteristics of Si BJTs and SiGe HBTs

  1. Martín-Martínez, M.J.
  2. Pérez, S.
  3. Pardo, D.
  4. González, T.
Journal:
Microelectronics Reliability

ISSN: 0026-2714

Year of publication: 2001

Volume: 41

Issue: 6

Pages: 847-854

Type: Article

DOI: 10.1016/S0026-2714(01)00022-1 GOOGLE SCHOLAR
Data source: Scopus