Microscopic investigation of large-signal noise in semiconductor materials and devices

  1. González, T.
  2. Pérez, S.
  3. Starikov, E.
  4. Shiktorov, P.
  5. Gružinskis, V.
  6. Reggiani, L.
  7. Varani, L.
  8. Vaissière, J.C.
Aktak:
Proceedings of SPIE - The International Society for Optical Engineering

ISSN: 0277-786X

Argitalpen urtea: 2003

Alea: 5113

Orrialdeak: 252-266

Mota: Biltzar ekarpena

DOI: 10.1117/12.488959 GOOGLE SCHOLAR
Datuen iturria: Scopus