A physically based investigation of the small-signal behaviour of bulk and fully-depleted silicon-on-insulator MOSFETs for microwave applications

  1. Rengel, R.
  2. Pardo, D.
  3. Martín, M.J.
Zeitschrift:
Semiconductor Science and Technology

ISSN: 0268-1242

Datum der Publikation: 2004

Ausgabe: 19

Nummer: 5

Seiten: 634-643

Art: Artikel

DOI: 10.1088/0268-1242/19/5/013 GOOGLE SCHOLAR
Datenquelle: Scopus