A physically based investigation of the small-signal behaviour of bulk and fully-depleted silicon-on-insulator MOSFETs for microwave applications

  1. Rengel, R.
  2. Pardo, D.
  3. Martín, M.J.
Aldizkaria:
Semiconductor Science and Technology

ISSN: 0268-1242

Argitalpen urtea: 2004

Alea: 19

Zenbakia: 5

Orrialdeak: 634-643

Mota: Artikulua

DOI: 10.1088/0268-1242/19/5/013 GOOGLE SCHOLAR
Datuen iturria: Scopus