3D monte carlo analysis of discrete dopant effects on electron noise in Si devices
- Dollfus, P.
- Velázquez, J.E.
- Bournel, A.
- Galdin-Retailleau, S.
Proceedings:
2004 10th International Workshop on Computational Electronics, IEEE IWCE-10 2004, Abstracts
ISBN: 9780780386495
Year of publication: 2004
Pages: 58-59
Type: Conference paper