Cryogenic performance of low-noise InP HEMTs: A Monte Carlo study

  1. Rodilla, H.
  2. Schleeh, J.
  3. Nilsson, P.-A.
  4. Wadefalk, N.
  5. Mateos, J.
  6. Grahn, J.
Journal:
IEEE Transactions on Electron Devices

ISSN: 0018-9383

Year of publication: 2013

Volume: 60

Issue: 5

Pages: 1625-1631

Type: Article

DOI: 10.1109/TED.2013.2253469 GOOGLE SCHOLAR
Data source: Scopus