Electronic transport and noise characterization in MoS2

  1. Pascual, E.
  2. Iglesias, J.M.
  3. Martín, M.J.
  4. Rengel, R.
Aldizkaria:
Semiconductor Science and Technology

ISSN: 1361-6641,  0268-1242

Argitalpen urtea: 2020

Alea: 35

Zenbakia: 5

Mota: Artikulua

DOI: 10.1088/1361-6641/AB7777 GOOGLE SCHOLAR
Datuen iturria: Scopus