Electronic transport and noise characterization in MoS2

  1. Pascual, E.
  2. Iglesias, J.M.
  3. Martín, M.J.
  4. Rengel, R.
Revue:
Semiconductor Science and Technology

ISSN: 1361-6641,  0268-1242

Année de publication: 2020

Volumen: 35

Número: 5

Type: Article

DOI: 10.1088/1361-6641/AB7777 GOOGLE SCHOLAR
La source de données: Scopus