Comparative analysis of current fluctuations in Si BJT's and SiGe HBT's
- Martin-Martinez, MJ
- Gonzalez, T
- Pardo, D
- Miura, N (coord.)
- Ando, T (coord.)
ISSN: 0930-8989, 1867-4941
ISBN: 3-540-41778-8
Datum der Publikation: 2001
Ausgabe: 87
Seiten: 1761-1762
Kongress: 25th International Conference on the Physics of Semiconductors (ICPS25)
Art: Konferenz-Beitrag