Comparative analysis of current fluctuations in Si BJT's and SiGe HBT's
- Martin-Martinez, MJ
- Gonzalez, T
- Pardo, D
- Miura, N (coord.)
- Ando, T (coord.)
ISSN: 0930-8989, 1867-4941
ISBN: 3-540-41778-8
Année de publication: 2001
Volumen: 87
Pages: 1761-1762
Congreso: 25th International Conference on the Physics of Semiconductors (ICPS25)
Type: Communication dans un congrès