Ellipsometric characterization of random and random-dimer GaAs-AlxGa1-xAs superlattices

  1. Bellani, V.
  2. Parravicini, G.B.
  3. Diez, E.
  4. Domínguez-Adame, F.
  5. Hey, R.
Revue:
Physical Review B - Condensed Matter and Materials Physics

ISSN: 0163-1829

Année de publication: 2002

Volumen: 66

Número: 19

Pages: 1933101-1933103

Type: Article

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La source de données: Scopus