A microscope interpretation of hot-electron noise in Schottky barrier diodes

  1. Gonzalez, T.
  2. Pardo, D.
  3. Varani, L.
  4. Reggiani, L.
Journal:
Semiconductor Science and Technology

ISSN: 0268-1242

Year of publication: 1994

Volume: 9

Issue: 5 S

Pages: 580-583

Type: Article

DOI: 10.1088/0268-1242/9/5S/049 GOOGLE SCHOLAR
Data source: Scopus