Influence of spatial correlations on the analysis of diffusion noise in submicron semiconductor structures

  1. Mateos, J.
  2. González, T.
  3. Pardo, D.
Revue:
Applied Physics Letters

ISSN: 0003-6951

Année de publication: 1995

Volumen: 67

Pages: 685

Type: Article

DOI: 10.1063/1.115203 GOOGLE SCHOLAR
La source de données: Scopus