Monte Carlo Analysis of the Behavior and Spatial Origin of Electronic Noise in GaAs MESFET's
- González, T.
- Pardo, D.
- Varani, L.
- Reggiani, L.
ISSN: 1557-9646, 0018-9383
Year of publication: 1995
Volume: 42
Issue: 5
Pages: 991-998
Type: Article
ISSN: 1557-9646, 0018-9383
Year of publication: 1995
Volume: 42
Issue: 5
Pages: 991-998
Type: Article