Analysis of voltage noise in forward-biased silicon bipolar homojunctions: Low- and high-injection regimes

  1. Martín, M.J.
  2. Pardo, D.
  3. Velázquez, J.E.
Journal:
Applied Physics Letters

ISSN: 0003-6951

Year of publication: 1997

Volume: 71

Issue: 23

Pages: 3382-3384

Type: Article

DOI: 10.1063/1.120554 GOOGLE SCHOLAR