Analysis of voltage noise in forward-biased silicon bipolar homojunctions: Low- and high-injection regimes

  1. Martín, M.J.
  2. Pardo, D.
  3. Velázquez, J.E.
Revue:
Applied Physics Letters

ISSN: 0003-6951

Année de publication: 1997

Volumen: 71

Número: 23

Pages: 3382-3384

Type: Article

DOI: 10.1063/1.120554 GOOGLE SCHOLAR