Effect of dimensionality on shot-noise suppression in nondegenerate diffusive conductors

  1. Gonzalez, T.
  2. Mateos, J.
  3. Pardo, D.
  4. Bulashenko, O.M.
  5. Reggiani, L.
Journal:
Microelectronics Reliability

ISSN: 0026-2714

Year of publication: 2000

Volume: 40

Issue: 11

Pages: 1951-1954

Type: Article

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Data source: Scopus