Effect of dimensionality on shot-noise suppression in nondegenerate diffusive conductors

  1. Gonzalez, T.
  2. Mateos, J.
  3. Pardo, D.
  4. Bulashenko, O.M.
  5. Reggiani, L.
Revue:
Microelectronics Reliability

ISSN: 0026-2714

Année de publication: 2000

Volumen: 40

Número: 11

Pages: 1951-1954

Type: Article