Transfer-field methods for electronic noise in submicron semiconductor structures

  1. Shiktorov, P.
  2. Starikov, E.
  3. Gružinskis, V.
  4. González, T.
  5. Mateos, J.
  6. Pardo, D.
  7. Reggiani, L.
  8. Varani, L.
  9. Vaissière, J.C.
Journal:
Rivista del Nuovo Cimento

ISSN: 0393-697X

Year of publication: 2001

Volume: 24

Issue: 9

Pages: 1-72

Type: Review