3D Monte Carlo study of thermal noise in DG-MOSFET

  1. Dollfus, P.
  2. Bournel, A.
  3. Velázquez, J.E.
Proceedings:
AIP Conference Proceedings

ISSN: 0094-243X 1551-7616

ISBN: 9780735402676

Year of publication: 2005

Volume: 780

Pages: 749-752

Type: Conference paper

DOI: 10.1063/1.2036858 GOOGLE SCHOLAR