A Monte Carlo investigation of the RF performance of partially-depleted SOI MOSFETs

  1. Rengel, R.
  2. Martín, M.J.
  3. Dambrine, G.
  4. Danneville, F.
Revue:
Semiconductor Science and Technology

ISSN: 0268-1242

Année de publication: 2006

Volumen: 21

Número: 3

Pages: 273-278

Type: Article

DOI: 10.1088/0268-1242/21/3/010 GOOGLE SCHOLAR
La source de données: Scopus