Sensitivity of single-and double-gate MOS architectures to residual discrete dopant distribution in the channel
- Dollfus, P.
- Bournel, A.
- Velázquez, J.E.
ISSN: 1572-8137, 1569-8025
Year of publication: 2006
Volume: 5
Issue: 2-3
Pages: 119-123
Type: Article