New boundary conditions for the study of charge transport in solid-state devices

  1. Volovichev, I.N.
  2. Velázquez-Pérez, J.E.
  3. Gurevich, Yu.G.
Konferenzberichte:
"2008 26th International Conference on Microelectronics, Proceedings, MIEL 2008"

ISBN: 9781424418824

Datum der Publikation: 2008

Seiten: 151-154

Art: Konferenz-Beitrag

DOI: 10.1109/ICMEL.2008.4559245 GOOGLE SCHOLAR
Datenquelle: Scopus