New boundary conditions for the study of charge transport in solid-state devices

  1. Volovichev, I.N.
  2. Velázquez-Pérez, J.E.
  3. Gurevich, Yu.G.
Proceedings:
"2008 26th International Conference on Microelectronics, Proceedings, MIEL 2008"

ISBN: 9781424418824

Year of publication: 2008

Pages: 151-154

Type: Conference paper

DOI: 10.1109/ICMEL.2008.4559245 GOOGLE SCHOLAR

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