New boundary conditions for the study of charge transport in solid-state devices
- Volovichev, I.N.
- Velázquez-Pérez, J.E.
- Gurevich, Yu.G.
Actes de conférence:
"2008 26th International Conference on Microelectronics, Proceedings, MIEL 2008"
ISBN: 9781424418824
Année de publication: 2008
Pages: 151-154
Type: Communication dans un congrès