Monte Carlo study of impact ionization and hole transport in InAs HEMTs with isolated gate
- Vasallo, B.G.
- Rodilla, H.
- Gonzalez, T.
- Moschetti, G.
- Grahn, J.
- Mateos, J.
Actes de conférence:
Proceedings of the 8th Spanish Conference on Electron Devices, CDE'2011
ISBN: 9781424478637
Année de publication: 2011
Type: Communication dans un congrès