Enhancement of sub-terahertz detection by drain-to-source biasing on strained silicon MODFET devices
- Meziani, Y.M.
- Morozov, S.
- Notario, J.A.D.
- Maremyanin, K.
- Velázquez, J.E.
- Fobelets, K.
ISSN: 1742-6596, 1742-6588
Year of publication: 2015
Volume: 647
Issue: 1
Type: Conference paper