5 kV multielectron beam lithography: MAPPER tool and resist process characterization

  1. Rio, D.
  2. Constancias, C.
  3. Martin, M.
  4. Icard, B.
  5. Van Nieuwstadt, J.
  6. Vijverberg, J.
  7. Pain, L.
Zeitschrift:
Journal of Vacuum Science and Technology B:Nanotechnology and Microelectronics

ISSN: 2166-2754 2166-2746

Datum der Publikation: 2010

Ausgabe: 28

Nummer: 6

Art: Artikel

DOI: 10.1116/1.3517664 GOOGLE SCHOLAR