Spatial analysis of electronic noise in submicron semiconductor structures

  1. González, T.
  2. Pardo, D.
  3. Varani, L.
  4. Reggiani, L.
Journal:
Applied Physics Letters

ISSN: 0003-6951

Year of publication: 1993

Volume: 63

Issue: 1

Pages: 84-86

Type: Article

DOI: 10.1063/1.109705 GOOGLE SCHOLAR