Langevin forces and generalized transfer fields for noise modeling in deep submicron devices

  1. Shiktorov, P.
  2. Starikov, E.
  3. Gruzinskis, V.
  4. Gonzalez, T.
  5. Mateos, J.
  6. Pardo, D.
  7. Reggiani, L.
  8. Varani, L.
  9. Vaissière, J.C.
Revue:
IEEE Transactions on Electron Devices

ISSN: 0018-9383

Année de publication: 2000

Volumen: 47

Número: 10

Pages: 1992-1998

Type: Article

DOI: 10.1109/16.870587 GOOGLE SCHOLAR
La source de données: Scopus