RF noise in a short-channel n-MOSFET: A Monte Carlo study
- Rengel, R.
- Mateos, J.
- Pardo, D.
- González, T.
- Martín, M.J.
ISSN: 0255-5476
Year of publication: 2002
Volume: 384-385
Pages: 155-158
Type: Conference paper
Book Series:
Materials Science Forum