Influence of 2D electrostatic effects on the high-frequency noise behaviour of sub-100 nm scaled MOSFETs
- Rengel, R.
- Pardo, D.
- Martín, M.J.
Aktak:
Proceedings of SPIE - The International Society for Optical Engineering
ISSN: 0277-786X
Argitalpen urtea: 2004
Alea: 5470
Orrialdeak: 96-106
Mota: Biltzar ekarpena