Influence of 2D electrostatic effects on the high-frequency noise behaviour of sub-100 nm scaled MOSFETs
- Rengel, R.
- Pardo, D.
- Martín, M.J.
ISSN: 0277-786X
Année de publication: 2004
Volumen: 5470
Pages: 96-106
Type: Communication dans un congrès
Actes de conférence:
Proceedings of SPIE - The International Society for Optical Engineering