Impact of the scaling on the noise performance of deep-submicron Si/SiGe n-channel FETs
- Velázquez, J.E.
- Fobelets, K.
- Gaspari, V.
Proceedings:
Proceedings of SPIE - The International Society for Optical Engineering
ISSN: 0277-786X
Year of publication: 2004
Volume: 5470
Pages: 573-580
Type: Conference paper